Vilchis, Rogelio José Scougall <br/><br/>
Examination of enamel-adhesive interface with focused ion beam and scanning electron microscopy.  [electronic resource] 

 -  American journal of orthodontics and dentofacial orthopedics : official publication of the American Association of Orthodontists, its constituent societies, and the American Board of Orthodontics  May 2007 
 - 646-50 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1097-6752 
<br/><br/><label>Standard No.: </label>10.1016/j.ajodo.2006.11.017  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Acid Etching, Dental--methods<br/>Bicuspid--drug effects<br/>Dental Bonding<br/>Dental Enamel--drug effects<br/>Dental Materials<br/>Dentin-Bonding Agents--therapeutic use<br/>Humans<br/>Microscopy, Electron, Scanning<br/>Orthodontic Brackets<br/>Phosphoric Acids<br/>Resin Cements--therapeutic use<br/>Surface Properties