Park, Keunhan <br/><br/>
Topography imaging with a heated atomic force microscope cantilever in tapping mode.  [electronic resource] 

 -  The Review of scientific instruments  Apr 2007 
 - 043709 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S. 
<br/><br/><label>ISSN: </label>0034-6748 
<br/><br/><label>Standard No.: </label>10.1063/1.2721422  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Calibration<br/>Hot Temperature<br/>Microscopy, Atomic Force--methods