TY  - GEN
AU  - Li,Ya-Ping
AU  - Lee,Cheng-Chung
TI  - Simulation of intensity of a patterned thin-film structure
SN  - 1559-128X
PY  - 2007///0711
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1364/ao.46.002244
ER  -