Li, Ya-Ping <br/><br/>
Simulation of intensity of a patterned thin-film structure.  [electronic resource] 

 -  Applied optics  Apr 2007 
 - 2244-7 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1559-128X 
<br/><br/><label>Standard No.: </label>10.1364/ao.46.002244  doi