TY  - GEN
AU  - Deji,Shizuhiko
AU  - Ito,Shigeki
AU  - Ariga,Eiji
AU  - Mori,Kazuyuki
AU  - Hirota,Masahiro
AU  - Saze,Takuya
AU  - Nishizawa,Kunihide
TI  - Electromagnetic malfunction of semiconductor-type electronic personal dosimeters caused by access control systems for radiation facilities
SN  - 0017-9078
PY  - 2006///0816
KW  - Artifacts
KW  - Equipment Design
KW  - Equipment Failure
KW  - Equipment Failure Analysis
KW  - Health Physics
KW  - instrumentation
KW  - Industry
KW  - Occupational Exposure
KW  - analysis
KW  - Radiation
KW  - Radiation Dosage
KW  - Radiation Protection
KW  - Radiometry
KW  - Reproducibility of Results
KW  - Security Measures
KW  - Semiconductors
KW  - Sensitivity and Specificity
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1097/01.HP.0000200262.33337.32
ER  -