Lyuksyutov, S F <br/><br/>
Atomic force microscope tip spontaneous retraction from dielectric surfaces under applied electrostatic potential.  [electronic resource] 

 -  Ultramicroscopy   
 - 909-13 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>0304-3991 
<br/><br/><label>Standard No.: </label>10.1016/j.ultramic.2006.04.002  doi