TY  - GEN
AU  - Crimp,Martin A
TI  - Scanning electron microscopy imaging of dislocations in bulk materials, using electron channeling contrast
SN  - 1059-910X
PY  - 2006///0615
KW  - Electrons
KW  - Microscopy, Electron, Scanning
KW  - methods
N1  - Publication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S.; Review
UR  - https://doi.org/10.1002/jemt.20293
ER  -