Crimp, Martin A <br/><br/>
Scanning electron microscopy imaging of dislocations in bulk materials, using electron channeling contrast.  [electronic resource] 

 -  Microscopy research and technique  May 2006 
 - 374-81 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S.; Review 
<br/><br/><label>ISSN: </label>1059-910X 
<br/><br/><label>Standard No.: </label>10.1002/jemt.20293  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electrons<br/>Microscopy, Electron, Scanning--methods