Lee, Cheng-Chung <br/><br/>
Influence of monitor passband width on the layer thickness determination during deposition of a dense-wavelength-division-multiplexing filter.  [electronic resource] 

 -  Applied optics  Mar 2006 
 - 1344-8 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1559-128X 
<br/><br/><label>Standard No.: </label>10.1364/ao.45.001344  doi