Hu, Yingsong <br/><br/>
Three-dimensional profilometry based on shift estimation of projected fringe patterns.  [electronic resource] 

 -  Applied optics  Feb 2006 
 - 678-87 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1559-128X 
<br/><br/><label>Standard No.: </label>10.1364/ao.45.000678  doi