TY  - GEN
AU  - Du,K
AU  - Wang,Y M
AU  - Lichte,H
AU  - Ye,H Q
TI  - Measurement of crystal thickness and orientation from selected-area Fourier transformation of a high-resolution electron hologram
SN  - 0968-4328
PY  - 2006///0126
KW  - Crystallization
KW  - Fourier Analysis
KW  - Image Processing, Computer-Assisted
KW  - Microscopy, Electron, Transmission
KW  - methods
N1  - Publication Type: Journal Article; Research Support, Non-U.S. Gov't
UR  - https://doi.org/10.1016/j.micron.2005.05.007
ER  -