Du, K <br/><br/>
Measurement of crystal thickness and orientation from selected-area Fourier transformation of a high-resolution electron hologram.  [electronic resource] 

 -  Micron (Oxford, England : 1993)  2006 
 - 67-72 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>0968-4328 
<br/><br/><label>Standard No.: </label>10.1016/j.micron.2005.05.007  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Crystallization<br/>Fourier Analysis<br/>Image Processing, Computer-Assisted<br/>Microscopy, Electron, Transmission--methods