TY  - GEN
AU  - Houck,A A
AU  - Labaziewicz,J
AU  - Chan,E K
AU  - Folk,J A
AU  - Chuang,I L
TI  - Kondo effect in electromigrated gold break junctions
SN  - 1530-6984
PY  - 2005///1102
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1021/nl050799i
ER  -