Houck, A A <br/><br/>
Kondo effect in electromigrated gold break junctions.  [electronic resource] 

 -  Nano letters  Sep 2005 
 - 1685-8 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1530-6984 
<br/><br/><label>Standard No.: </label>10.1021/nl050799i  doi