Le Page, Y <br/><br/>
Ab-initio primitive cell parameters from single convergent-beam electron diffraction patterns: a converse route to the identification of microcrystals with electrons.  [electronic resource] 

 -  Microscopy research and technique  Apr 1992 
 - 158-65 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1059-910X 
<br/><br/><label>Standard No.: </label>10.1002/jemt.1070210207  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Cerium--chemistry<br/>Crystallography--methods<br/>Cytological Techniques<br/>Electron Probe Microanalysis--methods