Ikeda, Takahiro <br/><br/>
Hilbert phase microscopy for investigating fast dynamics in transparent systems.  [electronic resource] 

 -  Optics letters  May 2005 
 - 1165-7 p.  digital 
<br/><br/> Publication Type: Evaluation Study; Journal Article; Research Support, N.I.H., Extramural; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, P.H.S. 
<br/><br/><label>ISSN: </label>0146-9592 
<br/><br/><label>Standard No.: </label>10.1364/ol.30.001165  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Computer Systems<br/>Equipment Design<br/>Equipment Failure Analysis<br/>Feasibility Studies<br/>Image Enhancement--instrumentation<br/>Microscopy, Interference--instrumentation<br/>Microscopy, Phase-Contrast--instrumentation<br/>Microscopy, Video--instrumentation<br/>Phantoms, Imaging