TY  - GEN
AU  - Jungk,T
AU  - Walther,T
AU  - Mader,W
TI  - Critical assessment of the speckle statistics in fluctuation electron microscopy and comparison to electron diffraction
SN  - 0304-3991
PY  - 2005///0929
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1016/j.ultramic.2005.04.003
ER  -