Jungk, T <br/><br/>
Critical assessment of the speckle statistics in fluctuation electron microscopy and comparison to electron diffraction.  [electronic resource] 

 -  Ultramicroscopy  Oct 2005 
 - 206-19 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>0304-3991 
<br/><br/><label>Standard No.: </label>10.1016/j.ultramic.2005.04.003  doi