Wang, Y M Maximum entropy image deconvolution applied to structure determination for crystal Nd1.85Ce0.15CuO4-delta. [electronic resource] - Micron (Oxford, England : 1993) 2005 - 393-400 p. digital Publication Type: Journal Article ISSN: 0968-4328 Standard No.: 10.1016/j.micron.2005.03.002 doi