Peng, W <br/><br/>
[Trace analysis of Zn-doped compound semiconductor material by resonant ionization mass spectrometry].  [electronic resource] 

 -  Guang pu xue yu guang pu fen xi = Guang pu  Feb 1999 
 - 16-8 p.  digital 
<br/><br/> Publication Type: English Abstract; Journal Article 
<br/><br/><label>ISSN: </label>1000-0593