Onoe, Jun <br/><br/>
In situ x-ray photoelectron spectroscopic and density-functional studies of Si atoms adsorbed on a C60 film.  [electronic resource] 

 -  The Journal of chemical physics  Dec 2004 
 - 11351-7 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>0021-9606 
<br/><br/><label>Standard No.: </label>10.1063/1.1814053  doi