TY  - GEN
AU  - Rasmussen,Akiko
AU  - Deckert,Volker
TI  - New dimension in nano-imaging: breaking through the diffraction limit with scanning near-field optical microscopy
SN  - 1618-2642
PY  - 2006///0613
KW  - Microscopy
KW  - methods
KW  - Nanotechnology
KW  - Spectrum Analysis
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1007/s00216-004-2896-3
ER  -