Schödel, René <br/><br/>
Highest-accuracy interferometer alignment by retroreflection scanning.  [electronic resource] 

 -  Applied optics  Nov 2004 
 - 5738-43 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1559-128X 
<br/><br/><label>Standard No.: </label>10.1364/ao.43.005738  doi