de Groot, Peter <br/><br/>
Signal modeling for low-coherence height-scanning interference microscopy.  [electronic resource] 

 -  Applied optics  Sep 2004 
 - 4821-30 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1559-128X 
<br/><br/><label>Standard No.: </label>10.1364/ao.43.004821  doi