TY  - GEN
AU  - Gasser,Philippe
AU  - Klotz,Ulrich E
AU  - Khalid,Fazal A
AU  - Beffort,Olivier
TI  - Site-specific specimen preparation by focused ion beam milling for transmission electron microscopy of metal matrix composites
SN  - 1431-9276
PY  - 2004///0916
KW  - Metals
KW  - chemistry
KW  - Microscopy, Electron
KW  - methods
KW  - Microscopy, Electron, Scanning
KW  - Models, Molecular
KW  - Resins, Synthetic
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1017/S1431927604040413
ER  -