Gasser, Philippe <br/><br/>
Site-specific specimen preparation by focused ion beam milling for transmission electron microscopy of metal matrix composites.  [electronic resource] 

 -  Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada  Apr 2004 
 - 311-6 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1431-9276 
<br/><br/><label>Standard No.: </label>10.1017/S1431927604040413  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Metals--chemistry<br/>Microscopy, Electron--methods<br/>Microscopy, Electron, Scanning--methods<br/>Models, Molecular<br/>Resins, Synthetic--chemistry