Suñé, J <br/><br/>
Hydrogen-release mechanisms in the breakdown of thin SiO2 films.  [electronic resource] 

 -  Physical review letters  Feb 2004 
 - 087601 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>0031-9007 
<br/><br/><label>Standard No.: </label>10.1103/PhysRevLett.92.087601  doi