ROTH, W L <br/><br/>
Measurement of the intensities of x-ray reflections from single crystals using a geiger counter x-ray spectrometer; application to beryllium oxide.  [electronic resource] 

 -  Science (New York, N.Y.)  Oct 1950 
 - 447 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>0036-8075 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Beryllium<br/>Humans<br/>Radiography<br/>Radiometry<br/>Spectrum Analysis<br/>X-Rays