Hersam, Mark C <br/><br/>
Detecting elusive surface atoms with atomic force microscopy.  [electronic resource] 

 -  Proceedings of the National Academy of Sciences of the United States of America  Oct 2003 
 - 12531-2 p.  digital 
<br/><br/> Publication Type: Comment; Journal Article 
<br/><br/><label>ISSN: </label>0027-8424 
<br/><br/><label>Standard No.: </label>10.1073/pnas.2335865100  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Microscopy, Atomic Force--methods<br/>Microscopy, Scanning Tunneling--methods<br/>Sensitivity and Specificity