TY  - GEN
AU  - Ohlendorf,D H
AU  - Collins,M L
AU  - Banaszak,L J
TI  - Analysis of optical diffraction patterns from electron micrographs of lattices
SN  - 0022-2836
PY  - 1976///0401
KW  - Crystallography
KW  - methods
KW  - Fourier Analysis
KW  - Mathematics
KW  - Microscopy, Electron
N1  - Publication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S.; Research Support, U.S. Gov't, P.H.S
UR  - https://doi.org/10.1016/s0022-2836(75)80164-1
ER  -