TY  - GEN
AU  - Chen,H
AU  - Beiersdorfer,P
AU  - Fournier,K B
AU  - Träbert,E
TI  - Soft-x-ray spectra of highly charged Kr ions in an electron beam ion trap
SN  - 1539-3755
PY  - 2002///0828
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1103/PhysRevE.65.056401
ER  -