Cheong, S K <br/><br/>
XAFS and X-ray reflectivity study of III-V compound native oxide/GaAs interfaces.  [electronic resource] 

 -  Journal of synchrotron radiation  Mar 2001 
 - 824-6 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>0909-0495 
<br/><br/><label>Standard No.: </label>10.1107/s0909049501001248  doi