TY  - GEN
AU  - Sasaki,K
AU  - Tsukimoto,S
AU  - Konno,M
AU  - Kamino,T
AU  - Saka,H
TI  - Dynamic chemical mapping near a Si/SiO2 interface at elevated temperatures using plasmon-loss images
SN  - 0022-2720
PY  - 2002///0823
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1046/j.1365-2818.2001.00911.x
ER  -