Wang, C M <br/><br/>
Phase determination and extension using X-ray multiple diffraction and the maximum-entropy method.  [electronic resource] 

 -  Acta crystallographica. Section A, Foundations of crystallography  Jul 2001 
 - 420-8 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>0108-7673 
<br/><br/><label>Standard No.: </label>10.1107/s0108767300018869  doi