Danuser, G <br/><br/>
Tracking differential interference contrast diffraction line images with nanometre sensitivity.  [electronic resource] 

 -  Journal of microscopy  Apr 2000 
 - 34-53 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, P.H.S. 
<br/><br/><label>ISSN: </label>0022-2720 
<br/><br/><label>Standard No.: </label>10.1046/j.1365-2818.2000.00678.x  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Algorithms<br/>Image Processing, Computer-Assisted<br/>Microscopy, Interference--methods<br/>Microtubules--ultrastructure<br/>Sensitivity and Specificity