TY  - GEN
AU  - Holmestad,R
AU  - Birkeland,C R
AU  - Marthinsen,K
AU  - Høier,R
AU  - Zuo,J M
TI  - Use of quantitative convergent-beam electron diffraction in materials science
SN  - 1059-910X
PY  - 1999///0922
KW  - Alloys
KW  - Materials Testing
KW  - Metals
KW  - Microscopy, Electron
KW  - instrumentation
KW  - Semiconductors
N1  - Publication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S.; Review
UR  - https://doi.org/10.1002/(SICI)1097-0029(19990715)46:2<130::AID-JEMT6>3.0.CO;2-O
ER  -