Thin Hf layers in Nb studied by the perturbed angular correlation method. I. Characterization of thin layers in Nb-Hf-Nb layered structures. [electronic resource]

Publication details: Physical review. B, Condensed matter May 1990Description: 9790-9793 p. digitalISSN:
  • 0163-1829
Online resources: In: Physical review. B, Condensed matter vol. 41
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Publication Type: Journal Article

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