Characterization of intermixing at metal-semiconductor interfaces by angle-resolved Auger-electron emission: Cu/Si(111)-7 x 7. [electronic resource]

Publication details: Physical review. B, Condensed matter May 1985Description: 6402-6410 p. digitalISSN:
  • 0163-1829
Online resources: In: Physical review. B, Condensed matter vol. 31
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Publication Type: Journal Article

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