Optimized acquisition parameters and statistical detection limit in quantitative EELS. [electronic resource]

By: Contributor(s): Producer: 19841219Description: 295-316 p. digitalISSN:
  • 0022-2720
Subject(s): Online resources: In: Journal of microscopy vol. 135
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Publication Type: Journal Article; Research Support, U.S. Gov't, P.H.S.

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