Temperature Dependence of Low Frequency Noise in Silicon on Insulator Tunneling Field Effect Transistor. [electronic resource]

By: Contributor(s): Publication details: Journal of nanoscience and nanotechnology Aug 2020Description: 4699-4703 p. digitalISSN:
  • 1533-4899
Online resources: In: Journal of nanoscience and nanotechnology vol. 20
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Publication Type: Journal Article

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