Modern Scattering-Type Scanning Near-Field Optical Microscopy for Advanced Material Research. [electronic resource]

By: Contributor(s): Publication details: Advanced materials (Deerfield Beach, Fla.) Jun 2019Description: e1804774 p. digitalISSN:
  • 1521-4095
Online resources: In: Advanced materials (Deerfield Beach, Fla.) vol. 31
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Publication Type: Journal Article; Review

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