The Micro-Analysis Estimation of 3D FinFET ICs in High Temperature Operation. [electronic resource]

By: Contributor(s): Publication details: Journal of nanoscience and nanotechnology 10 2018Description: 7100-7104 p. digitalISSN:
  • 1533-4880
Online resources: In: Journal of nanoscience and nanotechnology vol. 18
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Publication Type: Journal Article

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