APA
Zastrau U., Rödel C., Nakatsutsumi M., Feigl T., Appel K., Chen B., Döppner T., Fennel T., Fiedler T., Fletcher L. B., Förster E., Gamboa E., Gericke D. O., Göde S., Grote-Fortmann C., Hilbert V., Kazak L., Laarmann T., Lee H. J., Mabey P., Martinez F., Meiwes-Broer K., Pauer H., Perske M., Przystawik A., Roling S., Skruszewicz S., Shihab M., Tiggesbäumker J., Toleikis S., Wünsche M., Zacharias H., Glenzer S. H. & Gregori G. (20180302). A sensitive EUV Schwarzschild microscope for plasma studies with sub-micrometer resolution. : The Review of scientific instruments.
Chicago
Zastrau U, Rödel C, Nakatsutsumi M, Feigl T, Appel K, Chen B, Döppner T, Fennel T, Fiedler T, Fletcher L B, Förster E, Gamboa E, Gericke D O, Göde S, Grote-Fortmann C, Hilbert V, Kazak L, Laarmann T, Lee H J, Mabey P, Martinez F, Meiwes-Broer K-H, Pauer H, Perske M, Przystawik A, Roling S, Skruszewicz S, Shihab M, Tiggesbäumker J, Toleikis S, Wünsche M, Zacharias H, Glenzer S H and Gregori G. 20180302. A sensitive EUV Schwarzschild microscope for plasma studies with sub-micrometer resolution. : The Review of scientific instruments.
Harvard
Zastrau U., Rödel C., Nakatsutsumi M., Feigl T., Appel K., Chen B., Döppner T., Fennel T., Fiedler T., Fletcher L. B., Förster E., Gamboa E., Gericke D. O., Göde S., Grote-Fortmann C., Hilbert V., Kazak L., Laarmann T., Lee H. J., Mabey P., Martinez F., Meiwes-Broer K., Pauer H., Perske M., Przystawik A., Roling S., Skruszewicz S., Shihab M., Tiggesbäumker J., Toleikis S., Wünsche M., Zacharias H., Glenzer S. H. and Gregori G. (20180302). A sensitive EUV Schwarzschild microscope for plasma studies with sub-micrometer resolution. : The Review of scientific instruments.
MLA
Zastrau U, Rödel C, Nakatsutsumi M, Feigl T, Appel K, Chen B, Döppner T, Fennel T, Fiedler T, Fletcher L B, Förster E, Gamboa E, Gericke D O, Göde S, Grote-Fortmann C, Hilbert V, Kazak L, Laarmann T, Lee H J, Mabey P, Martinez F, Meiwes-Broer K-H, Pauer H, Perske M, Przystawik A, Roling S, Skruszewicz S, Shihab M, Tiggesbäumker J, Toleikis S, Wünsche M, Zacharias H, Glenzer S H and Gregori G. A sensitive EUV Schwarzschild microscope for plasma studies with sub-micrometer resolution. : The Review of scientific instruments. 20180302.