APA

Liu Z. Q., Liu J. H., Biegalski M. D., Hu J., Shang S. L., Ji Y., Wang J. M., Hsu S. L., Wong A. T., Cordill M. J., Gludovatz B., Marker C., Yan H., Feng Z. X., You L., Lin M. W., Ward T. Z., Liu Z. K., Jiang C. B., Chen L. Q., Ritchie R. O., Christen H. M. & Ramesh R. (20180110). Electrically reversible cracks in an intermetallic film controlled by an electric field. : Nature communications.

Chicago

Liu Z Q, Liu J H, Biegalski M D, Hu J-M, Shang S L, Ji Y, Wang J M, Hsu S L, Wong A T, Cordill M J, Gludovatz B, Marker C, Yan H, Feng Z X, You L, Lin M W, Ward T Z, Liu Z K, Jiang C B, Chen L Q, Ritchie R O, Christen H M and Ramesh R. 20180110. Electrically reversible cracks in an intermetallic film controlled by an electric field. : Nature communications.

Harvard

Liu Z. Q., Liu J. H., Biegalski M. D., Hu J., Shang S. L., Ji Y., Wang J. M., Hsu S. L., Wong A. T., Cordill M. J., Gludovatz B., Marker C., Yan H., Feng Z. X., You L., Lin M. W., Ward T. Z., Liu Z. K., Jiang C. B., Chen L. Q., Ritchie R. O., Christen H. M. and Ramesh R. (20180110). Electrically reversible cracks in an intermetallic film controlled by an electric field. : Nature communications.

MLA

Liu Z Q, Liu J H, Biegalski M D, Hu J-M, Shang S L, Ji Y, Wang J M, Hsu S L, Wong A T, Cordill M J, Gludovatz B, Marker C, Yan H, Feng Z X, You L, Lin M W, Ward T Z, Liu Z K, Jiang C B, Chen L Q, Ritchie R O, Christen H M and Ramesh R. Electrically reversible cracks in an intermetallic film controlled by an electric field. : Nature communications. 20180110.