APA

Crippa A., Maurand R., Kotekar-Patil D., Corna A., Bohuslavskyi H., Orlov A. O., Fay P., Laviéville R., Barraud S., Vinet M., Sanquer M., De Franceschi S. & Jehl X. (20171023). Level Spectrum and Charge Relaxation in a Silicon Double Quantum Dot Probed by Dual-Gate Reflectometry. : Nano letters.

Chicago

Crippa Alessandro, Maurand Romain, Kotekar-Patil Dharmraj, Corna Andrea, Bohuslavskyi Heorhii, Orlov Alexei O, Fay Patrick, Laviéville Romain, Barraud Sylvain, Vinet Maud, Sanquer Marc, De Franceschi Silvano and Jehl Xavier. 20171023. Level Spectrum and Charge Relaxation in a Silicon Double Quantum Dot Probed by Dual-Gate Reflectometry. : Nano letters.

Harvard

Crippa A., Maurand R., Kotekar-Patil D., Corna A., Bohuslavskyi H., Orlov A. O., Fay P., Laviéville R., Barraud S., Vinet M., Sanquer M., De Franceschi S. and Jehl X. (20171023). Level Spectrum and Charge Relaxation in a Silicon Double Quantum Dot Probed by Dual-Gate Reflectometry. : Nano letters.

MLA

Crippa Alessandro, Maurand Romain, Kotekar-Patil Dharmraj, Corna Andrea, Bohuslavskyi Heorhii, Orlov Alexei O, Fay Patrick, Laviéville Romain, Barraud Sylvain, Vinet Maud, Sanquer Marc, De Franceschi Silvano and Jehl Xavier. Level Spectrum and Charge Relaxation in a Silicon Double Quantum Dot Probed by Dual-Gate Reflectometry. : Nano letters. 20171023.