APA

Knapp T. J., Mohr R. T., Li Y. S., Thorgrimsson B., Foote R. H., Wu X., Ward D. R., Savage D. E., Lagally M. G., Friesen M., Coppersmith S. N. & Eriksson M. A. (20160706). Characterization of a gate-defined double quantum dot in a Si/SiGe nanomembrane. : Nanotechnology.

Chicago

Knapp T J, Mohr R T, Li Yize Stephanie, Thorgrimsson Brandur, Foote Ryan H, Wu Xian, Ward Daniel R, Savage D E, Lagally M G, Friesen Mark, Coppersmith S N and Eriksson M A. 20160706. Characterization of a gate-defined double quantum dot in a Si/SiGe nanomembrane. : Nanotechnology.

Harvard

Knapp T. J., Mohr R. T., Li Y. S., Thorgrimsson B., Foote R. H., Wu X., Ward D. R., Savage D. E., Lagally M. G., Friesen M., Coppersmith S. N. and Eriksson M. A. (20160706). Characterization of a gate-defined double quantum dot in a Si/SiGe nanomembrane. : Nanotechnology.

MLA

Knapp T J, Mohr R T, Li Yize Stephanie, Thorgrimsson Brandur, Foote Ryan H, Wu Xian, Ward Daniel R, Savage D E, Lagally M G, Friesen Mark, Coppersmith S N and Eriksson M A. Characterization of a gate-defined double quantum dot in a Si/SiGe nanomembrane. : Nanotechnology. 20160706.