APA

Appelquist T., Berkowitz E., Brower R. C., Buchoff M. I., Fleming G. T., Jin X., Kiskis J., Kribs G. D., Neil E. T., Osborn J. C., Rebbi C., Rinaldi E., Schaich D., Schroeder C., Syritsyn S., Vranas P., Weinberg E. & Witzel O. (20160210). Detecting Stealth Dark Matter Directly through Electromagnetic Polarizability. : Physical review letters.

Chicago

Appelquist T, Berkowitz E, Brower R C, Buchoff M I, Fleming G T, Jin X-Y, Kiskis J, Kribs G D, Neil E T, Osborn J C, Rebbi C, Rinaldi E, Schaich D, Schroeder C, Syritsyn S, Vranas P, Weinberg E and Witzel O. 20160210. Detecting Stealth Dark Matter Directly through Electromagnetic Polarizability. : Physical review letters.

Harvard

Appelquist T., Berkowitz E., Brower R. C., Buchoff M. I., Fleming G. T., Jin X., Kiskis J., Kribs G. D., Neil E. T., Osborn J. C., Rebbi C., Rinaldi E., Schaich D., Schroeder C., Syritsyn S., Vranas P., Weinberg E. and Witzel O. (20160210). Detecting Stealth Dark Matter Directly through Electromagnetic Polarizability. : Physical review letters.

MLA

Appelquist T, Berkowitz E, Brower R C, Buchoff M I, Fleming G T, Jin X-Y, Kiskis J, Kribs G D, Neil E T, Osborn J C, Rebbi C, Rinaldi E, Schaich D, Schroeder C, Syritsyn S, Vranas P, Weinberg E and Witzel O. Detecting Stealth Dark Matter Directly through Electromagnetic Polarizability. : Physical review letters. 20160210.