APA

Choi J. S., Chang Y. J., Woo S., Son Y., Park Y., Lee M. J., Byun I., Kim J., Choi C., Bostwick A., Rotenberg E. & Park B. H. (20150521). Correlation between micrometer-scale ripple alignment and atomic-scale crystallographic orientation of monolayer graphene. : Scientific reports.

Chicago

Choi Jin Sik, Chang Young Jun, Woo Sungjong, Son Young-Woo, Park Yeonggu, Lee Mi Jung, Byun Ik-Su, Kim Jin-Soo, Choi Choon-Gi, Bostwick Aaron, Rotenberg Eli and Park Bae Ho. 20150521. Correlation between micrometer-scale ripple alignment and atomic-scale crystallographic orientation of monolayer graphene. : Scientific reports.

Harvard

Choi J. S., Chang Y. J., Woo S., Son Y., Park Y., Lee M. J., Byun I., Kim J., Choi C., Bostwick A., Rotenberg E. and Park B. H. (20150521). Correlation between micrometer-scale ripple alignment and atomic-scale crystallographic orientation of monolayer graphene. : Scientific reports.

MLA

Choi Jin Sik, Chang Young Jun, Woo Sungjong, Son Young-Woo, Park Yeonggu, Lee Mi Jung, Byun Ik-Su, Kim Jin-Soo, Choi Choon-Gi, Bostwick Aaron, Rotenberg Eli and Park Bae Ho. Correlation between micrometer-scale ripple alignment and atomic-scale crystallographic orientation of monolayer graphene. : Scientific reports. 20150521.