APA
Agnese R., Ahmed Z., Anderson A. J., Arrenberg S., Balakishiyeva D., Basu Thakur R., Bauer D. A., Billard J., Borgland A., Brandt D., Brink P. L., Bruch T., Bunker R., Cabrera B., Caldwell D. O., Cerdeno D. G., Chagani H., Cooley J., Cornell B., Crewdson C. H., Cushman P., Daal M., Dejongh F., do Couto e Silva E., Doughty T., Esteban L., Fallows S., Figueroa-Feliciano E., Filippini J., Fox J., Fritts M., Godfrey G. L., Golwala S. R., Hall J., Harris R. H., Hertel S. A., Hofer T., Holmgren D., Hsu L., Huber M. E., Jastram A., Kamaev O., Kara B., Kelsey M. H., Kennedy A., Kim P., Kiveni M., Koch K., Kos M., Leman S. W., Loer B., Lopez Asamar E., Mahapatra R., Mandic V., Martinez C., McCarthy K. A., Mirabolfathi N., Moffatt R. A., Moore D. C., Nadeau P., Nelson R. H., Page K., Partridge R., Pepin M., Phipps A., Prasad K., Pyle M., Qiu H., Rau W., Redl P., Reisetter A., Ricci Y., Saab T., Sadoulet B., Sander J., Schneck K., Schnee R. W., Scorza S., Serfass B., Shank B., Speller D., Sundqvist K. M., Villano A. N., Welliver B., Wright D. H., Yellin S., Yen J. J., Yoo J., Young B. A. & Zhang J. (20140324). Silicon detector dark matter results from the final exposure of CDMS II. : Physical review letters.
Chicago
Agnese R, Ahmed Z, Anderson A J, Arrenberg S, Balakishiyeva D, Basu Thakur R, Bauer D A, Billard J, Borgland A, Brandt D, Brink P L, Bruch T, Bunker R, Cabrera B, Caldwell D O, Cerdeno D G, Chagani H, Cooley J, Cornell B, Crewdson C H, Cushman P, Daal M, Dejongh F, do Couto e Silva E, Doughty T, Esteban L, Fallows S, Figueroa-Feliciano E, Filippini J, Fox J, Fritts M, Godfrey G L, Golwala S R, Hall J, Harris R H, Hertel S A, Hofer T, Holmgren D, Hsu L, Huber M E, Jastram A, Kamaev O, Kara B, Kelsey M H, Kennedy A, Kim P, Kiveni M, Koch K, Kos M, Leman S W, Loer B, Lopez Asamar E, Mahapatra R, Mandic V, Martinez C, McCarthy K A, Mirabolfathi N, Moffatt R A, Moore D C, Nadeau P, Nelson R H, Page K, Partridge R, Pepin M, Phipps A, Prasad K, Pyle M, Qiu H, Rau W, Redl P, Reisetter A, Ricci Y, Saab T, Sadoulet B, Sander J, Schneck K, Schnee R W, Scorza S, Serfass B, Shank B, Speller D, Sundqvist K M, Villano A N, Welliver B, Wright D H, Yellin S, Yen J J, Yoo J, Young B A and Zhang J. 20140324. Silicon detector dark matter results from the final exposure of CDMS II. : Physical review letters.
Harvard
Agnese R., Ahmed Z., Anderson A. J., Arrenberg S., Balakishiyeva D., Basu Thakur R., Bauer D. A., Billard J., Borgland A., Brandt D., Brink P. L., Bruch T., Bunker R., Cabrera B., Caldwell D. O., Cerdeno D. G., Chagani H., Cooley J., Cornell B., Crewdson C. H., Cushman P., Daal M., Dejongh F., do Couto e Silva E., Doughty T., Esteban L., Fallows S., Figueroa-Feliciano E., Filippini J., Fox J., Fritts M., Godfrey G. L., Golwala S. R., Hall J., Harris R. H., Hertel S. A., Hofer T., Holmgren D., Hsu L., Huber M. E., Jastram A., Kamaev O., Kara B., Kelsey M. H., Kennedy A., Kim P., Kiveni M., Koch K., Kos M., Leman S. W., Loer B., Lopez Asamar E., Mahapatra R., Mandic V., Martinez C., McCarthy K. A., Mirabolfathi N., Moffatt R. A., Moore D. C., Nadeau P., Nelson R. H., Page K., Partridge R., Pepin M., Phipps A., Prasad K., Pyle M., Qiu H., Rau W., Redl P., Reisetter A., Ricci Y., Saab T., Sadoulet B., Sander J., Schneck K., Schnee R. W., Scorza S., Serfass B., Shank B., Speller D., Sundqvist K. M., Villano A. N., Welliver B., Wright D. H., Yellin S., Yen J. J., Yoo J., Young B. A. and Zhang J. (20140324). Silicon detector dark matter results from the final exposure of CDMS II. : Physical review letters.
MLA
Agnese R, Ahmed Z, Anderson A J, Arrenberg S, Balakishiyeva D, Basu Thakur R, Bauer D A, Billard J, Borgland A, Brandt D, Brink P L, Bruch T, Bunker R, Cabrera B, Caldwell D O, Cerdeno D G, Chagani H, Cooley J, Cornell B, Crewdson C H, Cushman P, Daal M, Dejongh F, do Couto e Silva E, Doughty T, Esteban L, Fallows S, Figueroa-Feliciano E, Filippini J, Fox J, Fritts M, Godfrey G L, Golwala S R, Hall J, Harris R H, Hertel S A, Hofer T, Holmgren D, Hsu L, Huber M E, Jastram A, Kamaev O, Kara B, Kelsey M H, Kennedy A, Kim P, Kiveni M, Koch K, Kos M, Leman S W, Loer B, Lopez Asamar E, Mahapatra R, Mandic V, Martinez C, McCarthy K A, Mirabolfathi N, Moffatt R A, Moore D C, Nadeau P, Nelson R H, Page K, Partridge R, Pepin M, Phipps A, Prasad K, Pyle M, Qiu H, Rau W, Redl P, Reisetter A, Ricci Y, Saab T, Sadoulet B, Sander J, Schneck K, Schnee R W, Scorza S, Serfass B, Shank B, Speller D, Sundqvist K M, Villano A N, Welliver B, Wright D H, Yellin S, Yen J J, Yoo J, Young B A and Zhang J. Silicon detector dark matter results from the final exposure of CDMS II. : Physical review letters. 20140324.