An occupational exposure assessment for engineered nanoparticles used in semiconductor fabrication. [electronic resource]
Producer: 20150810Description: 251-65 p. digitalISSN:- 1475-3162
- Aerosols -- analysis
- Air Pollutants, Occupational -- analysis
- Aluminum Oxide -- analysis
- Diatomaceous Earth -- analysis
- Environmental Monitoring -- methods
- Filtration -- instrumentation
- Humans
- Inhalation Exposure -- analysis
- Microscopy, Electron, Transmission
- Nanoparticles -- analysis
- Occupational Exposure -- analysis
- Semiconductors
- Spectrometry, X-Ray Emission
- Workplace
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Publication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S.
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